@InProceedings{Roberts2026TestFailureCharacterization,
  author     = {Trotter Roberts and Hugo Luck and Joud N. Satme and Mohsen Gol Zardian and Sina Navidi and Ryan Yount and Austin R.~J. Downey and Chao Hu},
  booktitle  = {Dynamic Evironments and Durability Testing, 2026, Vol. 7},
  title      = {Test-to-Failure Characterization and Acceleration Signal Feature Analysis of Electronic Systems Under Repeated Shock Loading},
  year       = {2026},
  pages      = {109--117},
  publisher  = {River Publishers},
  series     = {IMAC XLIV},
  collection = {IMAC XLIV},
  doi        = {10.1007/978-8-743-81446-7_9},
}